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Volume :24 Issue : 1 1997      Add To Cart                                                                    Download

One dimensional modeling of power reflection in microwave-detected photoconductance decay measurment

Auther : MOUSTAFA Y. GHANNAM AND SAMIR F. MAHMOUD

 Kuwait University, Department of Electrical and Computer Engineering, P. 0. Box 5969, Safat 13060, Kuwait

 ABSTRACT

A mathematical model based on a recursive reflection relation is developed and used for the calculation of the microwave power reflection in a Microwave Detected Photoconductance Decay carrier lifetime measuring system. Electrical equivalent circuit modeling of the same system is also proposed and used in the determination of the microwave reflectance and in the derivation of simple analytical closed form expressions for the optimum values of the measurement parameters. Treating the system using the electrical equivalent circuit model is found to very convenient since it has proven to be accurate for electrically thin single layers as well as or multiple layer samples.

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